Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. == Overview == Atomic force microscopy (AFM) gathers information by "feeling" or "touching" the surface with a mechanical probe.
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. == Overview == Atomic force microscopy (AFM) gathers information by "feeling" or "touching" the surface with a mechanical probe.
Source: Wikipedia "Atomic force microscopy" · CC BY-SA 4.0
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