Drive-level capacitance profiling

Drive-level capacitance profiling (DLCP) is a type of capacitance–voltage-profiling characterization technique developed specifically for amorphous and polycrystalline materials, which have more anomalies such as deep levels, interface states, or non-uniformities. Whereas in standard C–V profiles the charge response is assumed to be linear (dQ = CdV), in DLCP profiles the charge response is expected to have significant non-linear behavior (dQ = C0dV + C1(dV)2 + C2(dV)3) due to the significant larger AC-signal amplitude used in the DLCP technique.

Source: Wikipedia — Drive-level capacitance profiling (CC BY-SA 4.0)

Drive-level capacitance profiling

Drive-level capacitance profiling (DLCP) is a type of capacitance–voltage-profiling characterization technique developed specifically for amorphous and polycrystalline materials, which have more anomalies such as deep levels, interface states, or non-uniformities. Whereas in standard C–V profiles the charge response is assumed to be linear (dQ = CdV), in DLCP profiles the charge response is expected to have significant non-linear behavior (dQ = C0dV + C1(dV)2 + C2(dV)3) due to the significant larger AC-signal amplitude used in the DLCP technique.

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Source: Wikipedia "Drive-level capacitance profiling" · CC BY-SA 4.0

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