FAN algorithm (FAN-out oriented algorithm) is an algorithm for automatic test pattern generation (ATPG). It was invented in 1983 by Hideo Fujiwara and Takeshi Shimono at the Department of Electronic Engineering, Osaka University, Japan.
FAN algorithm (FAN-out oriented algorithm) is an algorithm for automatic test pattern generation (ATPG). It was invented in 1983 by Hideo Fujiwara and Takeshi Shimono at the Department of Electronic Engineering, Osaka University, Japan.
Source: Wikipedia "FAN algorithm" · CC BY-SA 4.0
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