Photoconductance decay or Photoconductivity decay (PCD or PC), is a non-destructive analytical technique used to measure the lifetime of minority charge carriers in a semiconductor, especially in silicon wafers. The technique studies the transient photoconductivity of a semiconductor sample during or after it is illuminated by a light pulse.
Photoconductance decay or Photoconductivity decay (PCD or PC), is a non-destructive analytical technique used to measure the lifetime of minority charge carriers in a semiconductor, especially in silicon wafers. The technique studies the transient photoconductivity of a semiconductor sample during or after it is illuminated by a light pulse.
Source: Wikipedia "Photoconductance decay" · CC BY-SA 4.0
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