Scan chain
Scan chain is a technique used in design for testing (DFT). The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC. It simplifies the testing and debugging of complex digital systems.
Scan chain is a technique used in design for testing (DFT). The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC. It simplifies the testing and debugging of complex digital systems.
Scan chain is a technique used in design for testing (DFT). The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC. It simplifies the testing and debugging of complex digital systems.
Source: Wikipedia "Scan chain" · CC BY-SA 4.0
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